A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
| Publication | Article in Microscopy, published October 2004 |
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| Authors | Muneyuki Fukuda, Satoshi Tomimatsu, Kuniyasu Nakamura, Masanari Koguchi, Hiroyasu Shichi, Kaoru...[ show more ] |
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