High total dose effects on CMOS/SOI technology
| Publication | Article in IEEE Transactions on Nuclear Science, published June 1992 |
|---|---|
| Authors | O. Flament, E. Dupont-Nivet, J.L. Leray, J.F. Pere, E. Delagnes, A.J. Auberton-Herve, B. Giffard,...[ show more ] |
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