Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar (\bf 11{\overline 2}2) GaN layers grown from the sidewall of an r-patterned sapphire substrate
| Publication | Article in Journal of Applied Crystallography, published September 2013 |
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| Authors | S. Lazarev, S. Bauer, T. Meisch, M. Bauer, I. Tischer, M. Barchuk, K. Thonke, V. Holy, F. Scholz,...[ show more ] |
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