Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
| Publication | Article in Journal of Crystal Growth, published March 2011 |
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| Authors | A.N. Danilewsky, J. Wittge, A. Croell, D. Allen, P. McNally, P. Vagovič, T. dos Santos Rolo, Z....[ show more ] |
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