Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype
| Publication | Article in Journal of Instrumentation, published July 2016 |
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| Authors | M. Benoit, J. Bilbao de Mendizabal, G. Casse, H. Chen, K. Chen, F.A. Di Bello, D. Ferrere, T....[ show more ] |
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