Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications
| Publication | Article in Journal of Instrumentation, published October 2016 |
|---|---|
| Authors | Q. Arnaud, E. Armengaud, C. Augier, A. Benoît, L. Bergé, J. Billard, J. Blümer, T. de Boissière,...[ show more ] |
This is the public page for a publication record in Dimensions, a free research insights platform that brings together information about funding, scholarly outputs, policy, patents and grants.
Loading metrics…