On the Thermal Failure in Nanoscale Devices: Insight towards Heat Transport Including Critical BEOL and Design Guidelines for Robust Thermal Management & EOS/ESD Reliability
| Publication | Article published April 2011 |
|---|---|
| Authors | Mayank Shrivastava, Manish Agrawal, Jasmin Aghassi, Harald Gessner, Wolfgang Molzer, Thomas...[ show more ] |
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