Inelastic mean-free path and mean escape depth of 10–140 eV electrons in SiO 2 nanoparticles determined by Si 2p photoelectron yields
| Publication | Article in Physical Chemistry Chemical Physics, published June 2023 |
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| Authors | E Antonsson, F Gerke, B Langer, C Goroncy, T Dresch, T Leisner, C Graf, E Rühl |
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