Importance of TEM sample thickness for measuring strain fields
| Publication | Article in Ultramicroscopy, published September 2023 |
|---|---|
| Authors | Sangjun Kang, Di Wang, Christian Kübel, Xiaoke Mu |
This is the public page for a publication record in Dimensions, a free research insights platform that brings together information about funding, scholarly outputs, policy, patents and grants.
Loading metrics…